To Do list

1. FE-I2
   1. more statistics both on single chips and modules
   2. understand plateau value of in-time efficiency (why lower than FE-I1 ?)
   3. noise, charge, (in-time) spatial resolution, long and ganged pixels characterization etc. etc.
   
   Milano

2. First irradiated modules : Why 90 % efficiency?

   Given the very not-uniform irradiation and large dose variations even with a single chip:

   1. Efficiency vs irradiation dose (i.e. vs row number and for individual chips)
      This implies:
   2. Depletion vs irradiation dose (i.e. vs row number and for individual chips)
   3. Charge vs irradiation dose (i.e. vs row number and for individual chips)
   
   Milano

3. High Intensity (Do we loose efficiency at high occupancy ?)
   Efficiency vs beam intensity
   Accurate studies need tracks reconstructed in pixel telescope (Genova to provide it)
   
   Prague, Milano, Genova

4. Total collected Charge
   1. vs TOT calibration
      1. un-irradiated
      2. irradiated
   2. vs irradiation
   3. vs Sensor Producer
   
   Dortmund

5. Interactions in silicon
   Genova
6. Charge trapping
   Milano

Tools for <= 2003

1. Reconstruction and alignment code for strips telescope - h8
   Milano
2. Alignment code for pixels telescope
   Genova (to provide)
3. Multi-tracks Pattern Recognition
4. Code for interactions (looking for vertices
   Genova (to provide)
5. Calibrations

Tools for 2004 combined run Non covered in this meeting

1. Detector description as in ATHENA
2. Reconstruction as in ATHENA
3. Simulation as in ATHENA
4. Alignment as in ATHENA
5. Conditions (calibrations) database as in ATHENA
6. Bytestream

Tools for 2004 Stand-alone testbeam

Measurements in 2004 Standalone

Measurements in 2004 Combined