• Measurement of efficiency for different sensor/chip assemblies: the principal reasons of inefficiency both for irradiated and not irradiated sensors were recognized.

• Comparison within efficiencies of different front end chips.

• Measurement of charge collection efficiency inside pixels for different sensor designs (both irradiated and not irradiated), detecting an inefficiency in the most promising design (T2). From these studies ideas to recover this problem emerged and were already incorporated in the new designs.

• Measurement of the depletion depth of irradiated sensors.

• Measurement of Lorentz angle both for irradiated and not irradiated sensors.

• Measurement of intrinsic resolution as a function of azimuthal angle, for different sensor designs. Various algorithms were developed and tested. Comparison within digital and analog information was performed.

      

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RESULTS  

ATLAS Week & Pixel Workshop presentations

   

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Milano Pixel Home Page

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